2008 IEEE International Symposium on Industrial Electronics // 18 November 2008 The test procedure of electrical drives for Distributed Generation (DG) systems generally requires the installation of dedicated prototypes on site: this is an expensive, time and power consuming procedure. In recent years, the availability of high performance calculation platforms has made possible to perform… Continua a leggere Hardware in the Loop (HIL) test bench for small-scale Distributed Generation systems