{"id":18047,"date":"2008-11-18T22:53:53","date_gmt":"2008-11-18T21:53:53","guid":{"rendered":"https:\/\/engie-eps.com\/?p=18047"},"modified":"2008-11-18T22:53:53","modified_gmt":"2008-11-18T21:53:53","slug":"hardware-in-the-loop-hil-test-bench-for-small-scale-distributed-generation-systems","status":"publish","type":"post","link":"https:\/\/devplugin.interactionfarm.com\/?p=18047","title":{"rendered":"Hardware in the Loop (HIL) test bench for small-scale Distributed Generation systems"},"content":{"rendered":"<p><strong>2008 IEEE International Symposium on Industrial Electronics \/\/ 18 November 2008<\/strong><\/p>\n<p>The test procedure of electrical drives for Distributed Generation (DG) systems generally requires the installation of dedicated prototypes on site: this is an expensive, time and power consuming procedure.<\/p>\n<p>In recent years, the availability of high performance calculation platforms has made possible to perform these tests using Hardware in the Loop (HIL) test benches before the plant installation. A HIL environment allows reducing costs and saving time because an implementation error can be easily identified and it is possible to test fault conditions in a safety way. This paper presents a general HIL test bench for DG electrical drive testing. Experimental results emulating different DG sources and plant have been provided to validate the approach.<\/p>\n<p><a href=\"http:\/\/ieeexplore.ieee.org\/document\/4677136\/\" target=\"_blank\" rel=\"noopener noreferrer\">READ MORE<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>2008 IEEE International Symposium on Industrial Electronics \/\/ 18 November 2008 The test procedure of electrical drives for Distributed Generation (DG) systems generally requires the installation of dedicated prototypes on site: this is an expensive, time and power consuming procedure. In recent years, the availability of high performance calculation platforms has made possible to perform&hellip; <a class=\"more-link\" href=\"https:\/\/devplugin.interactionfarm.com\/?p=18047\">Continua a leggere <span class=\"screen-reader-text\">Hardware in the Loop (HIL) test bench for small-scale Distributed Generation systems<\/span><\/a><\/p>\n","protected":false},"author":3,"featured_media":18051,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":[],"categories":[16],"tags":[],"_links":{"self":[{"href":"https:\/\/devplugin.interactionfarm.com\/index.php?rest_route=\/wp\/v2\/posts\/18047"}],"collection":[{"href":"https:\/\/devplugin.interactionfarm.com\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/devplugin.interactionfarm.com\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/devplugin.interactionfarm.com\/index.php?rest_route=\/wp\/v2\/users\/3"}],"replies":[{"embeddable":true,"href":"https:\/\/devplugin.interactionfarm.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=18047"}],"version-history":[{"count":1,"href":"https:\/\/devplugin.interactionfarm.com\/index.php?rest_route=\/wp\/v2\/posts\/18047\/revisions"}],"predecessor-version":[{"id":23164,"href":"https:\/\/devplugin.interactionfarm.com\/index.php?rest_route=\/wp\/v2\/posts\/18047\/revisions\/23164"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/devplugin.interactionfarm.com\/index.php?rest_route=\/wp\/v2\/media\/18051"}],"wp:attachment":[{"href":"https:\/\/devplugin.interactionfarm.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=18047"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/devplugin.interactionfarm.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=18047"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/devplugin.interactionfarm.com\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=18047"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}